Week In Review: Auto, Security, Pervasive Computing
AutomotiveKLA announced four tools for automotive chip making. The 8935 high productivity patterned wafer inspection system, the C205 broadband plasma patterned wafer inspection system, the Surfscan SP A2/A3 unpatterned wafer inspection systems, and I-PAT inline defect part average testing screening system, which uses data collected from other KLA tools at critical process steps. Cadence will […]
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